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AIMArtis Integration Manager
面议ULTRA PROBING SYSTEMTouch probe system with ultra wideband transmission technology
面议SMARTNET™Modular Sensors Network
面议OPTOCLOUD EDUQuality Control Beyond Limits
面议BIOREACTORMagnetic Separation System
面议XPLORELINE在线直径测量用激光测微器
面议XLS XY双轴测量用激光直径测量仪
面议XLS单轴测量用激光直径测量仪
面议XBrowser, XViewer and Tuning Board过程数据收集-工业4.0
面议X7金属成形和板料成形的过程监控
面议X5强大的金属成形和钣金成形过程监控系统
面议X3s金属成形及钣金成形过程的智能监控
面议The STIL SYSTEMS SERIES are made up of different models, each dedicated to one or several applications, in Industrial and Labs environment, 24/7.
Combined with the huge variety of STIL MARPOSS Point sensor heads, allow to offer excellent metrological performance off-line and in-line.
Flexibe, Easy-to-Use and respectfull of environmental constraints, STIL SYSTEMS are standard or Customized to correspond to Non Contact Measurement and Defects Inspection within madatory Cycle Time: from 4 seconds to measure Automotive Car Glass or complete smartphone.
STIL SYSTEMS solutions are used in multiple application contexts and on every kind of surface reflectivity as transparent or opaque, shiny or diffusing
优势 Part number | MIME-3M1R-115 | MIME-3M3R-115 | |
Model | MIME-3M1R-115 | MIME-3M3R-115 | |
X-Y Parameters | Travel | 100 | 100 |
Encoder | No | Yes | |
Position accuracy | 10µm/100mm | 1µm/100mm | |
Position resolution | 0,1µm | 0,1µm | |
Flatness | 1µm/100mm | 1µm/100mm | |
Max. speed | 20mm/s | 20mm/s | |
Z Parameters | Travel | 50 | 50 |
Encoder | Yes | Yes | |
Position accuracy | 1µm/100mm | 1µm/100mm | |
Position resolution | 0,1µm | 0,1µm | |
Flatness | 1µm/100mm | 1µm/100mm | |
Max. speed | 5mm/s | 5mm/s | |
Dimension (lxdxh) | 640x612x606 | 640x612x606 | |
Weight (kg) | 120 | 120 |